X-ray Photoelectron Spectroscopy - National instrument

This application from SINTEF has been given 1st priority by SINTEF stiftelsen. (see separate letter from SINTEF) This application is for support towards the acquisition of an X-ray Photoelectron Spectroscope (XPS). XPS is a technique used for the study o f surfaces. XPS yields elemental information from only the first few atomic layers of a material. Diverse groups in SINTEF MK have expressed an interest in obtaining a modern machine but none have had the finance to initiate acquisition. NFR’s support w ill make this possible. An advanced surface characterisation facility will also be of immense value to other SINTEF groups outside SINTEF MK. It is envisaged that this instrument will be considered as a national instrument and that many diverse universi ty groups will be active users. This application includes a number of expressions of interest from departments at UiO, NTNU and UiT.