Very fast general purpose EDXRF detector with added feature

Energy Dispersive X-Ray Fluorescence (EDXRF) spectroscopy analysis is one of the best analytical techniques to perform non-destructive elemental analyses all kinds of material samples, both solids and liquids. It is a proven and much used technique for material analysis in a broad range of industries and applications. The most important part of such EDXRF spectroscopic analyzers is the X-ray detector but the speed of the state-of-the-art detectors for such use on the market today is limited. Increasing this speed would bring essential benefits in many of the EDXRF applications, such as process control in metal production and in sorting of materials for recycling. This R&D project is based on a patent applied new invention that can increase the detection speed of such detectors significantly without compromising other qualities. The new invention also adds the new and extra feature of full-field XRF-imaging capability, an area of increased general interest and which can spur many new uses and applications for this detector. The scientific ambition for this R&D project is the realization of a fully working prototype that will successfully demonstrate such detector. Refer to previous report regarding activities performed earlier (i.e. secondary goals that are completed). Current updated status in this project is: The final 2D-matrix readout ASIC (2DA) is now developed (new since previous report), a customized silicon sensor with a 2D pattern that topologically is matching the 2D pattern of the 2DA ASIC (this sensor is mentioned before), new bump-bonding (flip-chip) of the 2DA ASIC with the silicon sensor, several test PCB's (new since previous report), the final version Data-Acquisition-System (DAS) (new since previous report), a new version testing SW, and, a new cooling technology is developed in order to perform tests with temperature of the sensor/ASIC at below -10C. The above development have been followed by testing and analysis and results so far indicate a high degree of functionality with respect to our ambitions. The project is in the process of acquiring a 1GBq 55Fe gamma source and during the summer/autumn 2016 we are aiming at performing all tests and thereby fully demonstrate this technology. The above developments have in 2016 been followed by testing of the detector with the use of the now purchased 55Fe source. The results are very good and in line with our ambitions. We have achieved summed spectrum with spectral resolution of 250eV (@ 5.9keV). We have not yet obtained measurements at maximum speed, because we have not managed to get the source in a position to be intense enough (or that the source is weaker than the vendor has specified). But the detector exhibits full performance up to the rate that the source can provide, which is approximately 10% of our ambition, and all indications are that the detector will operate to maximum ambition rate. Otherwise, in 2016, the project and results have been presented at two international conferences and has been well received. In parallel to continued work on testing and demonstration of the detector, we are working also with business development. This includes discussions with two of the most important manufacturers in the market for XRF equipment. In 2017, until the end of this project, we have had contact with a potential customer / partner and have tailored a demo device that is currently being tested. SW has been improved for easier use for outsiders and with new 2D pixel map function.

Energy Dispersive X-Ray Fluorescence (EDXRF) spectroscopy analysis is one of the best analytical techniques to perform non-destructive elemental analyses all kinds of material samples, both solids and liquids. It is a proven and much used technique for ma terial analysis in a broad range of industries and applications. The most important part of such EDXRF spectroscopic analyzers is the X-ray detector but the speed of the state-of-the-art detectors for such use on the market today is limited. Increasing th is speed would bring essential benefits in many of the EDXRF applications, such as process control in metal production and in sorting of materials for recycling. This R&D project is based on a patent applied new invention that can increase the detection speed of such detectors significantly without compromising other qualities. The new invention also adds the new and extra feature of full-field XRF-imaging capability, an area of increased general interest and which can spur many new uses and applications for this detector. The scientific ambition for this R&D project is the realization of a fully working prototype of such detector that will successfully demonstrate.